Worldwide System for Conformity Testing and Certification of Electrotechnical Equipment and Components (IECEE)
Committee of Testing Laboratories |
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| QUICK ACCESS TO PRODUCT CATEGORIES |
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CTL DECISION SHEETS |
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Clause |
Subject |
Keywords |
Sheet |
2.16 |
Destruction test on capacitors with segmented metallization |
Segmented metallization |
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Clause |
Subject |
Keywords |
Sheet |
4 |
Sampling plan |
- Capacitance |
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17 |
Use of the previous tested sample |
- Test time |
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Clause |
Subject |
Keywords |
Sheet |
3 |
Sampling plan |
- Capacitance |
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8 |
Measurement of tangent of loss angle on capacitors |
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Discharge resistor |
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Searching a sheet may be done using the Edit/find command in the browser:
Then click on the number Sheet to see the Decision Sheet. |
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