Worldwide System for Conformity Testing and Certification of Electrotechnical Equipment and Components (IECEE)
Committee of Testing Laboratories |
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| QUICK ACCESS TO PRODUCT CATEGORIES |
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CTL DECISION SHEETS |
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Clause |
Subject |
Keywords |
Sheet |
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Probe impedance for plug discharge test |
- Probe impedance |
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Clause |
Subject |
Keywords |
Sheet |
-- |
Rule for creepage across grooves and similar surface discontinuities |
- Creepage |
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IEC 60664-1:2002(ed.1.2) |
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Clause |
Subject |
Keywords |
Sheet |
4.2, 6.2 |
Creepage and clearance determination, groove, recess, corner, bridging of distance X |
-Creepage |
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Clause |
Subject |
Keywords |
Sheet |
7.1, 7.2, Fig. 2 |
Ball pressure test |
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Lens with a reticule |
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